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A one-stop software platform which applies analytics to data created by on-chip Agents?


  • Improve Quality : Achieve near-zero DPPM at the push of a button. Gain insights from every and all chips for high resolution and accurate outlier detection and increased test coverage based on real system application.
  • Ensure Reliability : Gain advance alerts on faults before they become failures, achieving true predictive maintenance and higher MTBF. Prevent disrupted service and epidemics, and reduce time-to-resolution with insights for root cause analysis.
  • Increase Operational Efficiency : Achieve higher parametric yields, with increased observability. Gain early detection of systematic production shifts and drifts, and advance fine binning for operational flexibility.
  • Reduce Time-to-Market : Reach volume production faster through expedited product ramp-up and test-time reduction, at a higher level of certainty.
  • Optimize Products : Gain visibility during design into the production performance, power and parametric yields, and insights during production for performance tuning.


  • On-chip monitoring with deep data analytics
  • IC health & performance monitoring from design to field
  • Quality and yield optimization
  • In-field predictive maintenance

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