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Overview

The DesignWare Self-Test and Repair (STAR) Memory System is a comprehensive, integrated test, repair and diagnostics solution that supports repairable or non-repairable embedded memories across any foundry or process node. Silicon-proven in over a billion chips on a range of process nodes, the STAR Memory System is a cost-effective solution for improving test quality and repair of manufacturing faults found in advanced processes. The STAR Memory System s highly automated design implementation and diagnostic flow, including Silicon Browser and Yield Accelerator, enables SoC designers to achieve quick design closure and significantly improve time-to-market and time-to-yield in volume production. The STAR Memory System includes optimized test algorithms specifically targeted at increasing coverage for memory defects like process variation and resistive faults that are prevalent at smaller process nodes, including 28-nm and 14/16-nm FinFET. Synopsys asked its customers-design engineers, R&D managers, and more-to share their experiences using DesignWare Embedded Memories, Logic Libraries and STAR Memory System. Browse the survey results to read their comments, see statistics on their power, performance, area, and yield improvements, and review complete case studies.

Features

  • Superior diagnostic capabilities for quick bring-up of working silicon, enables quick ramp to volume production
  • Automated testbench capabilities and proven validation flow for successful bring up of first silicon on automatic test equipment
  • Tight integration of memory with test and repair through STAR Memory System for minimal impact on timing and area, resulting in quick timing closure
  • Protection from multiple transient errors through ECC Compiler
  • Advanced failures diagnostic capabilities such as physical failed bitmaps, XY coordinate identification and fault classification of failures reduces time-to-yield and time-to-volume
  • STAR Memory System for Embedded Flash provides comprehensive test coverage and in-field diagnostics of the failure mechanisms associated with embedded flash

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